Future Plans
Vision: Expand the NCI competencies and technologies to
address NDC problems both at LLNL and partner institutions
Quantitative NDC for Additive Manufacturing (AM)
- NDC is required to characterize inaccessible surfaces, and density and composition variations; determine physical properties: geometry, density, elemental & molecular composition, thermal, structural, mechanical, stress state, radioactive assay, etc., in all three dimensions and as a function of time
- Employ acoustic feedback during the AM process
More Quantitative NDC by Multi-spectral and Multi-modal Methods
- Expand the spectral range of NDC imaging technologies and increase the synergism between different technologies/methodologies
- For example, using high spatial and energy resolution, spectroscopic detector arrays
- Couple multi-energy CT with the SIRZ algorithm
NDC for Chip Assurance
- X-ray CT for verification of integrated circuits with synchrotron or laboratory sources
- Faster chip assurance
- Investigate techniques such as limited-view CT and ptychography
Additional NCI Goals
- As-built modeling — unite diverse and non-coupled technologies such as design and modeling, materials development, characterization and testing, process monitoring and control, reverse engineering, and reuse and waste management into a global package of integration and iteration
- Portability and speed — reduce the size of new NDC systems to that of a small suitcase while also decreasing the inspection time
- Faster 3D imaging of dynamic events
- Fused neutron and x-ray CT algorithms
- Faster more accurate models
- Partner with government, academia, labs, and industry
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